Stephen J. Lieb is a partner in the New York office of Frommer Lawrence & Haug LLP.

Mr. Lieb specializes in patent litigation. In addition, Mr. Lieb prepares and prosecutes patent applications covering a wide variety of technologies including electronics, integrated circuit design and fabrication, digital communications, cryptography, and on-line financial systems.

Mr. Lieb has a bachelor's degree in physics from Union College and a Master's degree in materials engineering from Rensselaer Polytechnic Institute. He received his law degree from Fordham University. Mr. Lieb is a member of the New York State Bar and is registered to practice before the U.S. Patent and Trademark Office.


Bar Admission

New York (1996)
New Jersey (1997) (Inactive)
Registered to practice before
U.S. Patent and Trademark Office


Union College (B.S., 1983)
Rensselaer Polytechnic Institute
(M.S., 1986)
Fordham University (J.D., 1996)


New York Intellectual Property
Law Association

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