William F. Lawrence is one of the founding partners of Frommer Lawrence & Haug LLP. Mr. Lawrence has more than 25 years experience in the chemical, biotech, mechanical and computer fields. He represents a number of large and small international corporations in all intellectual property areas.

Mr. Lawrence is involved with counseling, licensing, opinion and appellate work, and supervises a large international patent and trademark application practice. He is an expert in patent interference proceedings and conducts other inter partes proceedings, such as trademark oppositions and litigation in district courts. He works closely with companies doing biological and chemical research to conclude complicated licensing deals and to form joint research ventures between universities and industry. He also conducts due diligence studies for emerging growth technologies and has lectured in the United States, Europe and Asia on a variety of intellectual property topics.

His extensive trademark experience has successfully guided clients through difficult trademark and domain name disputes and he is relied on by many companies to plan and execute worldwide trademark and domain name programs.

He is admitted to practice as an attorney in the State of New York and before several federal district and appellate courts including the Southern and Eastern Districts of New York, the Court of Appeals for the Federal Circuit and the Supreme Court of the United States. He is also admitted to practice before the United States Patent and Trademark Office.

Mr. Lawrence is a member of the American and New York State Bar Associations, American Institute of Physics, American Intellectual Property Law Association, the International Patent and Trademark Association, the International Trademark Association, and the European Communities Trade Mark Association. He has served as a member of the Board of Directors of the New York Intellectual Property Law Association and presently serves as a member of the U.S. Bar/JPO Liaison Council for the American Bar Association.


Bar Admission

New York (1977)
Registered to practice before
U.S. Patent and Trademark Office


Iona College (B.S., Physics, 1973)
St. John's University (J.D., 1976)
Sigma Pi Sigma


New York State and
American Bar Associations
American Institute of Physics
New York Patent, Trademark
and Copyright Law Association
(Board of Directors, 1993-1996)
American Intellectual Property
Law Association
International Patent and
Trademark Association
International Trademark Association
(Member, Board of Editors,
The Trademark Reporter,
European Community Trademark

Primary Office

745 Fifth Avenue
New York, New York 10151
Telephone: (212) 588-0800
Fax: (212) 588-0500

Copyright 2005 Frommer Lawrence & Haug LLP. All Rights Reserved.
Click here to view Web Site Disclaimer.