Dillon Kim is an associate in the New York office of Frommer Lawrence & Haug LLP.

Mr. Kim graduated cum laude from Duke University with a B.S. in Biology; B.A. in Environmental Science and Policy and a minor in Chemistry. He received his J.D. from Georgetown University Law Center and his M.P.H. from Harvard University School of Public Health.


Bar Admission

New York (2003)
New Jersey (2003)
Registered to practice before
U.S. Patent and Trademark Office


Duke University
(B.S. Biology, 1996)
(B.A. Environmental Science
and Policy, 1996)
(Minor in Chemistry, 1996)
Georgetown University
Law Center (J.D., 2002)
Harvard University
School of Public Health
(M.P.H., 2002)


American Bar Association
New York Intellectual Property
Law Association

Primary Office

745 Fifth Avenue
New York, New York 10151
Telephone: (212) 588-0800
Fax: (212) 588-0500

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